Overview

INSTEMS-TE is an in situ TEM heating and electrical biasing system for combined thermal and electrical studies with stable atomic-scale imaging.

Model Variants

Two configurations are available on the same platform: INSTEMS-TE (Standard) and INSTEMS-TE Pro. Both support double-tilt operation and coupled heating + electrical biasing workflows inside the TEM.

INSTEMS-TE (Standard)
For routine in situ heating + electrical biasing experiments with reliable temperature control and pA-level measurement capability.

INSTEMS-TE Pro
Builds on the TE platform with enhanced coupled-field operation and expanded control features intended for more demanding experiments.

Specifications (Common)

Mini-lab compatibility	TE
Temperature range	RT – 800 °C *
Heating precision	± 0.1 °C *
Temperature measurement	Four-electrode method
EDS compatibility	Yes
Max output voltage	± 50 V *
Current range	0 – 60 mA *
Alpha (α) tilt	± 25° *
Beta (β) tilt	± 20° *
Tilt accuracy	< 0.1°
Spatial resolution	≤ 0.1 nm *

* Specifications depend on the TEM and the selected mini-lab / microscope configuration.

INSTEMS-TE vs INSTEMS-TE Pro

Feature	INSTEMS-TE	INSTEMS-TE Pro
Thermal control	✓	✓
Electrical biasing	✓	✓
Coupled heating & biasing	—	✓
Programmable heating	✓	✓
pA-level current measurement	✓	✓
Control software	Standard	Advanced (coupled-field)

Applications

• Semiconductor materials and devices
• Li-ion battery
• Device failure analysis
• Thermoelectric materials
• High-temperature deformation
• Creep deformation
• Piezoelectric materials
• Sensors
• Nanodevices
• Dielectrics

System Components

• Double-tilt holder
• Mini-labs
• Mini-lab transfer box
• Tool kit
• PC & software
• Control unit