Bestron INSTEMS-M
In situ straining inside TEM
Overview
INSTEMS‑M is an in situ TEM straining system designed for controlled mechanical loading during imaging, while maintaining double‑tilt operation.
It supports multiple loading modes (tension/compression, manual or automated cycles) with pm‑level driving control for repeatable experiments.
Highlights
Stable atomic-scale imaging
Ultimate sample drift < 50 pm/s
Spatial resolution ≤ 0.1 nm *
Spatial resolution ≤ 0.1 nm *
Double-tilt
α tilt up to ±20° *
β tilt up to ±10° *
β tilt up to ±10° *
Mechanical loading
Tension/compression, etc.
Auto, manual, cyclic loading
Auto, manual, cyclic loading
High-precision actuation
pm-level driving control
Actuation accuracy < 500 pm
Actuation accuracy < 500 pm
Specifications
| Actuation accuracy | < 500 pm |
|---|---|
| Maximum force | > 2 mN |
| Maximum displacement | 2 µm |
| Alpha (α) tilt | ±20° * |
| Beta (β) tilt | ±10° * |
| Tilt accuracy | < 0.1° |
| Spatial resolution | ≤ 0.1 nm * |
* Specifications depend on the TEM and the selected mini-lab / microscope configuration.
Applications
- Semiconductor materials and devices
- Li-ion battery
- Device failure analysis
- Thermoelectric materials
- High-temperature deformation
- Creep deformation
- Piezoelectric materials
- Sensors
- Nanodevices
- Dielectrics
System Components
- Double-tilt holder
- Mini-labs
- Mini-lab transfer box
- Tool kit
- PC & software
- Control unit
